Introduction
The field of X-ray fluorescence (XRF) spectroscopy is challenging and exciting. With advantages such as easy sample preparation, nondestructive rapid multi-element analysis, and the ability to screen unknowns in a wide array of sample matrices such as liquids, solids, slurries, powders, pastes, thin films, air filters, and many others; XRF offers a perfect complement to other types of analytical equipment found in the analytical lab.
Energy Dispersive X-ray Fluorescence (ED-XRF) spectroscopy is one of the simplest, most accurate and economical analytical methods for the determination of the chemical composition of many types of materials. The technique, requires minimum if any sample preparation, and is suitable for almost all sample types and shapes (solids, liquids, powders and thin films). In addition to elemental analysis, xrf may be used to measure the thickness and composition of multi-layer thin films.
